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Cleaning Treatment to Advance the Quality of FIB Samples for Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1166-1167
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- August 2004
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Thinning and Cleaning Treatment to Advance the Quality of FIB Samples for Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S03 / September 2003
- Published online by Cambridge University Press:
- 05 September 2003, pp. 526-527
- Print publication:
- September 2003
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Advances in Sample Preparation of Semiconductor Devices for Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 24 July 2003, pp. 800-801
- Print publication:
- August 2003
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